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probe into something

to investigate something. The police will probe into the matter and report to the commissioner. We will take some time and probe into that for you.
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probe something for something

to poke around in something for something. He probed his memory for some clue as to where he had been on that date. Sam probed the darkened space for the tool that he had mislaid.
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References in periodicals archive ?
Then, using another probe of the same kind, connect to the same point and see how the original trace changes because of the double probing.
Since periodontal probing is such an important aspect of the periodontal examination, the technique must be systematic and consistent.
The Agilent E2943A and E2944A comprise the industry's first solution that provides this ATCA interposer probing with AMC support for protocol analysis as well as protocol exercising.
Challenges in future full wafer testing include managing mechanical, thermal and materials compliance, while simultaneously enabling a very large area array probing solution populated with tens of thousands of geometrically precise contact structures that match the fine features of our customers' devices," said Ben Eldridge, FormFactor's Chief Technology Officer.
The new logic analysis application interacts with an on-chip virtual probing technology to enable logic analyzers to measure up to 64 internal FPGA signals for each debug pin compared to traditional logic analyzers, which measure a single internal FPGA signal for each debug pin.
Customers who want to use the latest high productivity 200mm probing solution from Electroglas can also cost-effectively upgrade existing 4080, 4090 and 4090 Micro prober systems with 4090 Micro Plus technology.
RPC involves creating a scan bus or built-in self-test (BIST) bus that allows complete die testing without probing all the pads.
The Agilent N5397A FPGA dynamic probe interacts with an on-chip virtual probing technology, enabling MSOs to capture up to 32 internal FPGA signals for each debug pin correlated to external analog activity.
FormFactor continuously develops new probing technologies to enable the semiconductor industry keep pace with trends in DRAM and flash manufacturing.
FormFactor also plans to apply its S200(TM) high-speed probing test technology in probe cards for the Kalos 2 to create a low-cost test solution for fully tested NOR flash die.
Multi-site probing speeds up the process even further and enables the test engineer to obtain reasonable sample sizes.